Description: Advanced Test Methods for Srams : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies, Paperback by Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud, ISBN 1489983147, ISBN-13 9781489983145, Brand New, Free shipping in the US Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.
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Book Title: Advanced Test Methods for Srams : Effective Solutions for Dynamic
Author: Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch
Language: english
